A Method for Beating the Diffraction Limit in Photolithography
January 1, 2001Etec Systems, Inc., An Applied Materials Company Physics, 2000-01
Liaison(s): Mike Bohan
Advisor(s): Peter Saeta
Students(s): Jamie Hadden (TL), Andrew Batley, Wilson Mui, Libby Schoene, John Walseth
Etec Systems, Inc. is a worldwide leader in the designing, manufacturing, and marketing of mask-making solutions for the semiconductor industry. Our Clinic team is providing Etec with a feasibility study on a potential technology for tightening the focus point of a laser on the photoresist layer of a mask beyond the normal diffraction limit, enabling the writing of smaller mask features. We report both analytical and experimental results.