Teradyne makes automatic test equipment (ATE) for semiconductor devices. As devices grow more complex, test vectors becomes much larger, and the time required to analyze the failures grows too long. The team developed a system, VisiFault, which graphically displays scan failure results from the ATE and physical fault results from a diagnosis program so one can quickly pinpoint causes of failures. VisiFault also provides functions such as aggregation and comparison to help in analyzing the data. This project was completed during a ten week full-time effort during the summer of 2001.