The Clinic team designed and prototyped a system with web-based interfaces for managing data from high-performance automated semiconductor test equipment based on distributed persistent data storage. Our system enables users of a test service to query and process results from a wide range of geographic sites using interfaces that decouple test equipment specifics. The system is entirely based on the emergent Java Two Enterprise Edition (J2EE) framework and includes capabilities for fault tolerance and recovery. This project was completed during a ten week full-time effort during the summer of 2002.