A Method for Beating the Diffraction Limit in Photolithography

Etec Systems, Inc.
2000–01

Etec Systems, Inc. is a worldwide leader in the designing, manufacturing, and marketing of mask-making solutions for the semiconductor industry.  Our Clinic team is providing Etec with a feasibility study on a potential technology for tightening the focus point of a laser on the photoresist layer of a mask beyond the normal diffraction limit, enabling the writing of smaller mask features.  We report both analytical and experimental results.

Advisor(s): Peter N. Saeta.